AUTOMATIC ION CURRENT CONTROL OF A DIRECT INLET SYSTEMFRANZEN J; KUPER H; RIEPE W et al.1973; INTERNATION. J. MASS SPECTROM. ION PHYS.; NETHERL.; DA. 1973; VOL. 10; NO 4; PP. 353-357; BIBL. 4 REF.Serial Issue

A LOW INTENSITY VERSATILE LABORATORY ION SOURCEBUHLER D; VOINOV M; TANNENBERGER H et al.1972; VACUUM; G.B.; DA. 1972; VOL. 22; NO 2; PP. 61; BIBL. 2 REF.Serial Issue

SOURCE AND BEHAVIOR OF SPURIOUS F⁺ SIGNALS IN ELECTRON IMPACT ION SOURCESYATES JT JR; KING DA.1972; J. VACUUM SCI. TECHNOL.; U.S.A.; DA. 1972; VOL. 9; NO 5; PP. 1256-1258; BIBL. 13 REF.Serial Issue

COMPARISON OF SOURCES OF BORON, PHOSPHORUS, AND ARSENIC IONSWILSON RG; JAMBA DM.1973; APPL. PHYS. LETTERS; U.S.A.; DA. 1973; VOL. 22; NO 4; PP. 176-179; BIBL. 1 REF.Serial Issue

ETUDE D'UNE SOURCE D'ANALYSEUR DE GAZ RESIDUELS PAR SIMULATION NUMERIQUEGAUTHERIN G; GRANDCHAMP JP.1972; VIDE; FR.; DA. 1972; NO 157, SUPPL; PP. 119-126; BIBL. 3 REF.Serial Issue

MEASUREMENTS OF BEAM EMITTANCE IN LOW ENERGY ION SOURCEMOCHIZUKI T; ARIKAWA T.1972; MASS SPECTROSC.; JAP.; DA. 1972; VOL. 20; NO 4; PP. 281-286; BIBL. 8 REF.Serial Issue

SESSION ON ION SOURCES1971; IN: 11TH SYMP. ELECTRON ION LASER BEAM TECHNOL. BOULDER, COLO, 1971. REC.; SAN FRANCISCO; SAN FRANCISCO PRESS; DA. 1971; PP. 577-636; BIBL. DISSEM.Conference Proceedings

ELECTRON LENSESMULVEY T; WALLINGTON MJ.1973; REP. PROGR. PHYS.; G.B.; DA. 1973; VOL. 36; NO 4; PP. 347-421; BIBL. 4 P. 1/2Serial Issue